期刊
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES
卷 50, 期 9, 页码 2196-2198出版社
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TMTT.2002.802335
关键词
helical slow-wave structure; interaction impedance; nonresonant perturbation measurement; traveling-wave tube
The measurement accuracy of the interaction impedance for a helical slow-wave structure (SWS) using the nonresonant perturbation method has been studied using conductive wire perturbers with different diameters. Data obtained by the measurement were compared with a rigorous numerical analysis. It is shown that the measured values of the interaction impedance for the helical SWS converge to those obtained by using a three-dimensional finite-element computational method when the diameter of the perturber is reduced to less than 10% of the helix diameter.
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