Characterisation of nanostructured silver orthophosphate

Fractal aggregates of nanoparticle silver orthophosphate were prepared by chemical precipitation. Structural characterisation was done using XRD, FTIR and TEM. Material characterisation is done by studying the dielectric behaviour at low frequency (100 Hz-10 MHz). It is found that nano-Ag3PO4 is a dielectric relaxor material of high dielectric constant. The effects of reactant concentration on cluster morphology and dielectric behaviour were also under investigation. (C) 2002 Elsevier Science B.V All rights reserved.