期刊
PHYSICAL REVIEW LETTERS
卷 89, 期 15, 页码 -出版社
AMERICAN PHYSICAL SOC
DOI: 10.1103/PhysRevLett.89.156803
关键词
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Light emission from a scanning tunneling microscope is used to investigate the electromagnetic coupling (EMC) of a metal tip and a metal sample. Subatomic scale modifications of the tip-sample region cause spectral shifts of the fluorescence as demonstrated for a monatomic step and by variation of the tip-sample distance. For sharp tips the EMC is confined to a lateral range of a few nm. The results are consistent with model calculations of the electromagnetic response of an appropriate tip-sample geometry.
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