期刊
IEEE ELECTRON DEVICE LETTERS
卷 23, 期 11, 页码 637-639出版社
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/LED.2002.803766
关键词
gallium compounds; microwave devices; noise measurement; semiconductor device noise
We report low microwave, noise performance of discrete AlGaN-GaN HEMTs at dc power dissipation comparable to that of GaAs-based low-noise FETs. At 1-V source-drain (SD) bias and dc power dissipation of 97 mW/mm, minimum noise figures (NFmin) of 0.75 dB at 10 GHz and 1.5 dB at 20 GHz were achieved, respectively. A device breakdown voltage of 40 V was observed. Both the low microwave noise performance at small dc power level and high breakdown voltage was obtained with a shorter SD spacing of 1.5 mum in. 0.15-mum gate length GaN HEMTs. By comparison, NFmin with 2 mum SD spacing was 0.2 dB greater at 10 GHz.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据