期刊
SOLID STATE IONICS
卷 154, 期 -, 页码 523-527出版社
ELSEVIER SCIENCE BV
DOI: 10.1016/S0167-2738(02)00506-4
关键词
oxygen diffusion; SIMS; mixed conductors; surface exchange
Oxygen diffusion and surface exchange coefficients have been determined for the materials La2Ni1 - xCoxO4 + delta by the Isotope Exchange Depth Profile Secondary Ion Mass Spectrometry (IEDP SIMS) method. It is shown that the addition of cobalt (0 < x < 0.5) leads to the formation of single-phase materials and that the oxygen diffusion coefficient varies only slightly with x. In contrast, the surface exchange coefficient was found to be strongly dependent upon the value of x, with the activation enthalpy for this process dropping to values as low as - 20 kJ mol(-1) for the high cobalt content material. (C) 2002 Elsevier Science B.V. All rights reserved.
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