期刊
APPLIED PHYSICS LETTERS
卷 81, 期 23, 页码 4428-4430出版社
AMER INST PHYSICS
DOI: 10.1063/1.1525056
关键词
-
Using dynamic force microscopy and spectroscopy in an ultrahigh vacuum (noncontact atomic force microscopy) at low temperatures, we measured three-dimensional force fields with atomic resolution. The method is based on the systematic recording of the frequency shift of a cantilever oscillating near the sample surface. The presented experimental results were obtained on a NiO(001) sample surface with an iron-coated silicon tip, but the measurement principle can be extended to any tip-sample system. (C) 2002 American Institute of Physics.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据