4.4 Article

Vacancy diffusion in the Cu(001) surface I: an STM study

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SURFACE SCIENCE
卷 521, 期 1-2, 页码 10-25

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ELSEVIER SCIENCE BV
DOI: 10.1016/S0039-6028(02)02250-1

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scanning tunneling microscopy; surface diffusion; copper; indium; surface defects

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We have used the indium/copper surface alloy to study the dynamics of surface vacancies on the Cu(001) surface. Individual indium atoms that are embedded within the first layer of the crystal, are used as probes to detect the rapid diffusion of surface vacancies. STM measurements show that these indium atoms make multi-lattice-spacing jumps separated by long time intervals. Temperature dependent waiting time distributions show that the creation and diffusion of thermal vacancies form an Arrhenius type process with individual long jumps being caused by one vacancy only. The length of the long jumps is shown to depend on the specific location of the indium atom and is directly related to the lifetime of vacancies at these sites on the surface. This observation is used to expose the role of step edges as emitting and absorbing boundaries for vacancies. (C) 2002 Elsevier Science B.V. All rights reserved.

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