Quantum well states (QWS's) in Cu thin films grown on Co/Cu(001) were studied using angle-resolved photoemission spectroscopy. For the normal photoemission, QWS's from both lower and higher energy bands relative to the vacuum level were measured, and explained by phase accumulation method. QWS's from the lower band were studied in detail as a function of the in-plane momentum k(parallel to). We found that the QWS dispersion depends on the Cu film thickness. From the experimental data, we deduced the quantized perpendicular momentum k(perpendicular to) and the energy as a function of k(parallel to). Our results show that the in-plane effective mass can not be obtained by a simple parabolic fitting of the E vs k(parallel to) due to the dependence of k(perpendicular to) on k(parallel to).
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