4.5 Article

Raman spectroscopic evidence of thickness dependence of the doping level of electrochemically deposited polypyrrole film

期刊

SYNTHETIC METALS
卷 132, 期 2, 页码 125-132

出版社

ELSEVIER SCIENCE SA
DOI: 10.1016/S0379-6779(02)00197-2

关键词

polypyrrole Raman spectroscopy; doping level; film thickness

向作者/读者索取更多资源

In this paper, we present resonance Raman spectroscopic studies on as-grown thin polypyrrole (PPy) films electrochemically deposited on flat platinum electrode surfaces by direct oxidation of pyrrole in acetonitrile. It was found that the overall features of the Raman spectra depend strongly on film thickness, mainly due to that the doping level of PPy increases during film growth process. Electrochemical and X-ray photoelectron spectroscopic (XPS) examinations have confirmed this discovery. The doping level of PPy film with a given thickness also depends on the property of supporting electrolyte. (C) 2002 Elsevier Science B.V. All rights reserved.

作者

我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。

评论

主要评分

4.5
评分不足

次要评分

新颖性
-
重要性
-
科学严谨性
-
评价这篇论文

推荐

暂无数据
暂无数据