4.7 Article

The phase diagram of the Yb-Si system

期刊

JOURNAL OF ALLOYS AND COMPOUNDS
卷 348, 期 1-2, 页码 100-104

出版社

ELSEVIER SCIENCE SA
DOI: 10.1016/S0925-8388(02)00809-5

关键词

rare earth compounds; crystal structure; phase diagram; thermal analysis; X-ray diffraction

向作者/读者索取更多资源

The phase diagram of the Yb-Si system has been studied up to about 80 at.% Si by means of multitechnique investigations: differential thermal analysis (DTA), X-ray diffraction (XRD), optical microscopy (LOM), electron probe microanalysis (EMPA) and complemented with tensimetric measurements using the Knudsen effusion-mass spectrometry (KE-MS) and Knudsen effusion-weight loss (KE-WL) techniques. Besides the four already known intermediate phases: Yb5Si3 (Mn5Si3-type), YbSi (CrB-type), Yb3Si5 (Th3Pd5-type) and YbSi2-x (AlB2-type), two new compounds have been found and completely characterized: Yb5Si4 (Sm5Ge4-type) and Yb3Si4 (Ho,Si.-type). Two eutectics occur in this system: at less than 1 at.% Si (815 degreesC) and at about 82 at.% Si (1145 degreesC). (C) 2002 Elsevier Science B.V. All rights reserved.

作者

我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。

评论

主要评分

4.7
评分不足

次要评分

新颖性
-
重要性
-
科学严谨性
-
评价这篇论文

推荐

暂无数据
暂无数据