期刊
REVIEW OF SCIENTIFIC INSTRUMENTS
卷 74, 期 2, 页码 1150-1152出版社
AMER INST PHYSICS
DOI: 10.1063/1.1531825
关键词
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Avalanche photodiode-based single photon counting modules (SPCMs) can be damaged by exposure to excessive light levels. A flexible and inexpensive failsafe is presented which has been shown to protect SPCMs from light levels far exceeding the damage threshold. (C) 2003 American Institute of Physics.
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