期刊
JOURNAL OF CRYSTAL GROWTH
卷 250, 期 3-4, 页码 486-498出版社
ELSEVIER SCIENCE BV
DOI: 10.1016/S0022-0248(02)02394-1
关键词
X-ray topography; organic compounds
Large crystals of TNT were grown from ethyl acetate solution by both temperature lowering and solvent evaporation. The perfection of crystals grown from seeds under carefully controlled conditions was generally higher than those prepared by uncontrolled solvent evaporation. Examination by X-ray topography revealed the crystals to have a characteristic growth induced defect structure comprising growth sectors and boundaries, growth banding, solvent inclusions and dislocations. Twins and stacking faults (SF) were also observed. Many of the defects noted in the topographs can be attributed to impurities. The influence of the highly anisotropic crystal structure on the nature of growth defects is discussed. A structural model proposed to explain twinning and SF formation is partially supported by topographic evidence. (C) 2003 Elsevier Science B.V. All rights reserved.
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