Nonlinear characterization of nanometer-thick dielectric layers by surface plasmon resonance techniques

The use of surface plasmon resonance as a powerful tool for the nonlinear characterization of ultrathin dielectric layers is investigated and experimentally demonstrated. The off-resonant intensity-dependent refractive index of 10-200-nm-thick films of the soluble polycarbazolyldiacetylene 1,6-bis-(3,6-dihexadecyl-N-carbazolyl)2,4-hexadiyne deposited upon silver was measured at 1064 nm and with picosecond pulses. (C) 2003 Optical Society of America.