期刊
IEEE TRANSACTIONS ON ELECTRON DEVICES
卷 50, 期 5, 页码 1227-1232出版社
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TED.2003.813462
关键词
charge-coupled devices (CCD); image intensifiers; low-light level imaging; noise; photon counting; single photon detection
Electron multiplying charge-coupled devices (EMCCDs) enable imaging with subelectron noise up to video frame rates and beyond, providing the multiplication gain is sufficiently high. The ultra-low noise, high resolution, high-quantum efficiency, and robustness to over exposure make these sensors ideally suited to applications traditionally served by image intensifiers. One important performance parameter of such low-light imaging systems is the noise introduced by the gain process. This work investigates the noise introduced by the electron multiplication within the EMCCD. The theory and measurements of the excess noise factor are presented. The measurement technique for determining the excess noise factor is described in detail. The results show that the noise performance matches that of the ideal staircase avalanche photodiode. A Monte Carlo method for simulating the low-light level images is demonstrated and the results compared with practical experience.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据