期刊
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES
卷 51, 期 5, 页码 1560-1566出版社
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TMTT.2003.810139
关键词
high-loss dielectrics; measurements; permittivity; uncertainty analysis
The transmission-reflection method is modified for measuring constitutive parameters of thin high-loss materials used as radar absorbers. The method uses a two-layer structure, consisting of a layer of thin flexible unknown material supported by a thicker rigid known material. The analysis and measurements focus on nonmagnetic samples of a high dielectric constant and loss factor and on the waveguide configuration in the X-band. A nonlinear least-squares optimization is used to obtain the complex permittivity from the measured scattering parameters. The uncertainty analysis presented facilitates selection of the support layer thickness. Simulations with the finite-difference time-domain method explore the effects of sample imperfections. Accuracy of a few percent can be achieved for a sample thickness of a fraction of a millimeter, provided that the thickness of the support dielectric is close to optimum and sample has only small surface imperfections.
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