4.7 Article

Interfacial reactions between Cu and SnAgCu solder doped with minor Ni

期刊

JOURNAL OF ALLOYS AND COMPOUNDS
卷 622, 期 -, 页码 529-534

出版社

ELSEVIER SCIENCE SA
DOI: 10.1016/j.jallcom.2014.10.121

关键词

Ni; Microstructure; Grain size

资金

  1. Ministry of Science and Technology, Taiwan, ROC [102-2221-E-005-009-MY3]

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The interfacial reactions between Cu and SnAgCu-based solders were investigated. Two types of SnAgCu-based solders were used, one was Sn-1.0Ag-0.5Cu (SAC105) and the other was Sn-1.2Ag-0.5Cu-0.05Ni (LF35), where the composition was in wt.%. The addition of Ni in the SnAgCu-based solder was found to have significant effects on the morphological evolution and growth of the Cu6Sn5 and Cu3Sn phases formed at the solder/Cu interfaces. At the Ni-added LF35/Cu interface after liquid/solid reaction at 260 degrees C,the Cu6Sn5 phase presented a microstructure with a much smaller grain size. During subsequent solid/solid reaction at 150 and 200 degrees C, the growth of the Cu6Sn5 phase was significantly enhanced at the LF35/Cu interface but that of the Cu3Sn phase was inhibited. A potential mechanism was proposed to explain the effects of Ni addition on the solder/Cu interfacial reactions. (C) 2014 Elsevier B. V. All rights reserved.

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