4.4 Article

Characterization of spray pyrolysed indium sulfide thin films

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SEMICONDUCTOR SCIENCE AND TECHNOLOGY
卷 18, 期 6, 页码 491-500

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IOP PUBLISHING LTD
DOI: 10.1088/0268-1242/18/6/317

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Indium sulfide thin films have been prepared using the chemical spray pyrolysis technique. Samples with different substrate temperatures and indium-to-sulfur (In/S) ratios have been prepared and characterized using x-ray diffraction (XRD), x-ray photoelectron spectroscopy, photosensitivity measurements and optical absorption studies. XRD studies have revealed that the samples are beta-In2S3. The optical bandgap has been found to decrease from 2.81 to 2.64 eV with the In/S ratio varying from 2/1 to 2/8. The photoresponse of the samples can be improved by changing either the In/S ratio in the solution or the substrate temperature. From this study we observe that, in terms of crystallinity, bandgap and photoresponse, the sample with the In/S ratio of 1.2/8 is very suitable for any photovoltaic application.

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