期刊
IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY
卷 13, 期 2, 页码 2607-2610出版社
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TASC.2003.811906
关键词
critical current; high T-c; IBAD; transport E-J; YBCO tape
We have investigated extended electric field-vs.-current density E-J characteristics in YBCO coated IBAD tapes. The results of a Monte-Carlo study on the depinning in a random pin medium were compared with measurements. Using a low temperature scanning laser microscope; we examined the percolative behavior of the local resistive transition in the YBCO tape. It was also shown that the depinning probability,' which is proportional to the. dynamic resistance of the E-J curves, is scaled as a function of reduced current density with the aid of a power index. Consequently, the E-J characteristics in the tapes can be described by the combination of the two kinds of scaling laws: one is the scaling law of the depinning probability predicted in a random network and the other is the scaling law for the flux pinning force: These properties agree well with the percolation model of depinned clusters.
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