4.6 Article

MSTAR: a submicrometer, absolute metrology system

期刊

OPTICS LETTERS
卷 28, 期 11, 页码 890-892

出版社

OPTICAL SOC AMER
DOI: 10.1364/OL.28.000890

关键词

-

类别

向作者/读者索取更多资源

The Modulation Sideband Technology for Absolute Ranging (MSTAR) sensor permits absolute distance measurement with subnanometer accuracy, an improvement of 4 orders of magnitude over current techniques. The system uses fast phase modulators to resolve the integer cycle ambiguity of standard interferometers. The concept is described and demonstrated over target distances up to 1 in. The design can be extended to kilometer-scale separations. (C) 2003 Optical Society of America.

作者

我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。

评论

主要评分

4.6
评分不足

次要评分

新颖性
-
重要性
-
科学严谨性
-
评价这篇论文

推荐

暂无数据
暂无数据