期刊
THIN SOLID FILMS
卷 433, 期 1-2, 页码 39-44出版社
ELSEVIER SCIENCE SA
DOI: 10.1016/S0040-6090(03)00310-9
关键词
laser ablation; chalcogenide thin film; tellurite thin film; praseodymium; erbium; optical properties; waveguides
We report on the pulsed laser deposition (PLD) of thin films of chalcogenide and tellurite glasses doped with RE ions. The depositions were performed in vacuum, for chalcogenide films, and in a low oxygen pressure for the tellurite films by using an excimer laser. After the deposition, the morphological, structural, optical and spectroscopical characteristics are analysed by different techniques: Scanning Electron Microscopy (SEM), X-ray Diffraction (XRD), Rutherford Backscattering Spectrometry (RBS), optical profilometry, m-lines spectroscopy, photoluminescence etc. The experimental results demonstrated that PLD is a suitable technique for the realisation of films of complex materials for optoelectronic and photonic applications. (C) 2003 Elsevier Science B.V. All rights reserved.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据