期刊
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS
卷 42, 期 6B, 页码 L680-L682出版社
JAPAN SOC APPLIED PHYSICS
DOI: 10.1143/JJAP.42.L680
关键词
aluminum fluoride; time-of-flight distribution; quadrupole mass spectrometer; aluminum subfluoride; sublimation
Thermal desorption behaviors of the AlF3 layer formed on Al2O3 in the sample temperature range from T-s = 300 to 930 K have been studied using molecular beam mass spectrometry combined with a time-of-flight (TOF) technique. Fluorine atoms were detected as the desorbed species at sample temperatures of T-s = 625 to 850 K and the intensity was found to be peaked at T-s = 750 K. AlF2 species whose translational temperature T-tr is approximately 100 K lower than T-s were also detected as desorbed species above T-s = 850 K and the intensity increased exponentially as T-s was raised. Based on these results, the desorption behavior of AlF3 species is discussed. [DOI: 10.1143/JJAP.42.L680].
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