期刊
COMPTES RENDUS PHYSIQUE
卷 4, 期 6, 页码 663-673出版社
ELSEVIER FRANCE-EDITIONS SCIENTIFIQUES MEDICALES ELSEVIER
DOI: 10.1016/S1631-0705(03)00097-5
关键词
degradation; catastrophic degradation; dark line defects; dark spot defects; recombination enhanced defect reaction; dislocation climb; dislocation glide
Degradation analysis is a crucial issue for the improvement of high power laser diodes. Degradation occurs in three different modes: rapid, gradual and catastrophic. It can be located inside the cavity or at the facet mirrors. Each type of degradation presents its own signature and different crystal defects appear associated with them. The main physical mechanisms responsible for laser degradation are analysed showing the relation between the main degradation modes and the different materials properties of the laser structures. (C) 2003 Academie des sciences. Published by Editions scientifiques et medicales Elsevier SAS. All rights reserved.
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