High-resolution electrostatic force microscopy (EFM)-phase measurements are reported on molecular networks of semiconductor polymer poly-hexylthiophene (P3HT) and DNA molecules. A lateral resolution of better than 20 nm is demonstrated in EFM-phase images of the P3HT network by detecting the phase shift of the tip along the molecules under electrical bias. Strands of lambda-DNA are shown to be highly insulating in comparison to the semiconductor polymer P3HT, with a minimum resistance of similar to1x10(7) Omega cm. (C) 2003 American Institute of Physics.
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