A new X-ray transmission-reflection scheme for the study of deeply buried interfaces using high-energy microbeams

We present a new experimental scheme for the high-resolution X-ray study of deeply buried interfaces, as they occur in novel functional nanomaterials and in nature. Our experimental approach is based on the preparation and the use of high energy X-ray microbeams and on stable and high-resolution mechanical diffraction stages. We discuss the principle of this technique and demonstrate its future potential for the study of functional interfaces by way of several proof-of-principle experiments which have been carried out at a prototype setup at the European Synchrotron Radiation Facility. (C) 2003 Elsevier Science B.V. All rights reserved.