期刊
MICROSCOPY AND MICROANALYSIS
卷 9, 期 4, 页码 337-342出版社
CAMBRIDGE UNIV PRESS
DOI: 10.1017/S143192760303023X
关键词
tungsten; work function; secondary electron emission; discharge lamps
The changes of the work function (Phi) and the secondary electron emission (SEE) of oxygen covered polycrystalline tungsten occurring after ion sputtering and heat treatments have been investigated. The chemical composition was analyzed by X-ray photoelectron spectroscopy (XPS), and the electron emission properties by work function spectroscopy (WFS). We observed in what manner the chemical changes of the surface are reflected in the work function and SEE. The simultaneous change of Phi and SEE in the case of oxygen covered tungsten have been pointed out and a direct relationship between them can be supposed.
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