期刊
PHYSICAL REVIEW B
卷 68, 期 7, 页码 -出版社
AMERICAN PHYSICAL SOC
DOI: 10.1103/PhysRevB.68.075211
关键词
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A simple technique employing reverse bias measurements of photoluminescent efficiency is described to determine the excitonic singlet-triplet formation statistics of electroluminescent organic thin films. Using this method, the singlet fractions in thin films of two organic emissive materials commonly used in organic light emitting devices, tris(8-hydroxyquinoline) aluminum (Alq(3)) and poly[2-methoxy-5-(2-ethylhexyloxy)-1,4-phenylenevinylene] (MEH-PPV), are found to be (20+/-1)% and (20+/-4)%, respectively. Results are confirmed using a sensitive synchronous detection scheme. We discuss other measurements and the current understanding of exciton formation statistics in polymeric and small molecular weight organic electroluminescent materials.
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