期刊
JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS
卷 64, 期 9-10, 页码 1859-1862出版社
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/S0022-3697(03)00172-0
关键词
chalcogenides; differential scanning calorimetry; X-ray diffraction; dielectric properties; semiconductivity
The ternary system Cu-Sn-S was re-investigated and the phase diagram Cu2S-SnS2 studied in detail by differential thermal analysis and X-ray diffractometry. Three phases of composition Cu4SnS4, Cu2SnS3 and Cu2Sn3+xS7+2x(0 less than or equal to x less than or equal to 1) were found exhibiting melting points at 833, 856 and 803 degreesC, respectively. Ellipsometric and diffuse reflectance measurements revealed that the latter two sulfides possess a fundamental band gap of 0.93 eV followed by a higher transitions. For the first time it could be demonstrated that Cu2Sn3S7 has semiconducting properties and an absorption coefficients of the order 10(5) cm(-1). (C) 2003 Elsevier Ltd. All rights reserved.
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