期刊
SOLAR ENERGY MATERIALS AND SOLAR CELLS
卷 79, 期 3, 页码 369-390出版社
ELSEVIER
DOI: 10.1016/S0927-0248(02)00473-7
关键词
titanium dioxides; antireflection coating; double-layer; DLAR; spectroscopic ellipsometry
This paper demonstrates that a double-layer antireflection (DLAR) coating call he fabricated using a single material, titanium dioxide (TiO2). The optical properties of the top and bottom TiO2 layers were controlled by varying the deposition and sintering conditions, resulting in a range of refractive indices, n = 1.73-2.63 at 600 nm. Weighted average reflectances of 6.5% (measured) and 7.0% (calculated) were achieved for TiO2 DLAR coatings in air and under glass, respectively. When implemented in a high-efficiency silicon solar cell, a short-circuit current density increase of DeltaJ(sc) = 2.5 mA/cm(2) can be expected for an optimised TiO2 DLAR coating when compared to a commercial TiO2 single-layer antireflection coating. Crown Copyright (C) 2003 Published by Elsevier Science B.V. All rights reserved.
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