期刊
APPLIED PHYSICS LETTERS
卷 83, 期 12, 页码 2366-2368出版社
AMER INST PHYSICS
DOI: 10.1063/1.1611278
关键词
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Scanning Kelvin probe microscopy (SKPM) has been used to simultaneously obtain high-resolution topographical and potential images of pentacene organic thin-film transistors (OTFTs) during device operation. SKPM images of OTFTs show large potential drops at the source with the magnitude dependent on contact metallurgy and relatively small potential drops at grain boundaries in polycrystalline pentacene films. (C) 2003 American Institute of Physics.
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