期刊
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
卷 131, 期 -, 页码 51-60出版社
ELSEVIER SCIENCE BV
DOI: 10.1016/S0368-2048(03)00091-4
关键词
insulators; charging; secondary electron emission; electron bombardment
类别
A UHV system equipped with a standard LEED/Auger diagnostic has been modified to permit the measurement of the coefficient of secondary electron emission, delta, under electron bombardment. In order to measure the coefficient on insulators, the beam is pulsed. Problems due to charging are alleviated by alternating between pulses in which the target charges negatively (delta < 1) and positively (delta > 1). The measuring technique is demonstrated by means of results obtained on mica and alumina. Residual and intrinsic charging effects are discussed. (C) 2003 Elsevier B.V. All rights reserved.
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