期刊
JOURNAL OF POLYMER SCIENCE PART B-POLYMER PHYSICS
卷 41, 期 21, 页码 2561-2583出版社
WILEY
DOI: 10.1002/polb.10659
关键词
ESCA/XPS; poly(3,4-ethylene dioxythiophene); conductivity; degradation; interfacial chemistry; conducting polymers
X-ray photoelectron spectroscopy (XPS) has been used to characterize poly(3,4-ethylene dioxythiophene)-poly(styrene sulfonate) (PEDT/PSS), one of the most common electrically conducting organic polymers. A correlation has been established between the composition, morphology, and polymerization mechanism, on the one hand, and the electric conductivity of PEDT/PSS, on the other hand. XPS has been used to identify interfacial reactions occurring at the polymer-on-ITO and polymer-on-glass interfaces, as well as chemical changes within the polymer blend induced by electrical stress and exposure to ultraviolet light. (C) 2003 Wiley Periodicals, Inc. J Polym Sci Part B: Polym Phys 41: 2561-2583, 2003
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