期刊
PHYSICAL REVIEW LETTERS
卷 91, 期 23, 页码 -出版社
AMER PHYSICAL SOC
DOI: 10.1103/PhysRevLett.91.235301
关键词
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We have studied the influence of the substrate on superfluidity in thin He-4 films. The inert coverage, the amount of nonsuperfluid He-4 localized by the substrate, is found to scale with the well depth of the He-4-substrate interaction potential for six different substrates. Although the inert coverages for these substrates differ by more than a factor of 4, the phase boundary in the temperature-coverage plane is found to have a universal shape.
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