期刊
APPLIED PHYSICS LETTERS
卷 83, 期 23, 页码 4731-4733出版社
AMER INST PHYSICS
DOI: 10.1063/1.1631396
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Transmission electron microscopy observations, cathodoluminescence spectroscopy and spectrum imaging are combined to investigate the emission spectrum in Cu(In,Ga)Se-2 (CIGS) thin films with improved spatial resolution. We report direct evidence for a surface layer of wider band gap, which forms spontaneously in CIGS films. The existence of such a surface layer is critical for attaining high efficiency in solar cells based on these chalcopyrite semiconductor compounds. (C) 2003 American Institute of Physics.
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