期刊
PHYSICAL REVIEW LETTERS
卷 91, 期 26, 页码 -出版社
AMERICAN PHYSICAL SOC
DOI: 10.1103/PhysRevLett.91.267202
关键词
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Magnetic force microscopy (MFM) measurements were performed on an exchange-biased CoO/(CoPt) multilayer sample at 7.5 K. Applying an external magnetic field of up to 7 T saturates the ferromagnetic layer and the remaining uncompensated antiferromagnetic spins at the antiferromagnet-ferromagnet interfaces are imaged with high lateral resolution. The coupling between the uncompensated spins and the spins in the ferromagnet are found to be antiferromagnetic. Quantitative analysis of the MFM images revealed that 7% of the spins at the interface are uncompensated and contribute to the exchange biasing.
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