4.6 Article

Polarization reversal anti-parallel to the applied electric field observed using a scanning nonlinear dielectric microscopy

期刊

APPLIED PHYSICS LETTERS
卷 84, 期 2, 页码 257-259

出版社

AMER INST PHYSICS
DOI: 10.1063/1.1637938

关键词

-

向作者/读者索取更多资源

Ultrahigh-density storage devices consisting of poling reversed nanodots are examined using a scanning nonlinear dielectric microscope (SNDM). By using the SNDM, real-time observation of the poling direction was attempted and an unexpected phenomenon was discovered. For lithium tantalite films thicker than 350 nm, poling directions were aligned anti-parallel to the poling electric field. The critical thickness is thought to be dependent on the material properties, the probe radius, the applied voltage and the pulse duration. This anti-parallel poling phenomenon disagrees with previous poling reversal mechanisms from the conventional plate capacitor model. At present, the reason for and details of anti-parallel poling reversal are unclear, but may be related to the concentrated electric field near the cantilever. (C) 2004 American Institute of Physics.

作者

我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。

评论

主要评分

4.6
评分不足

次要评分

新颖性
-
重要性
-
科学严谨性
-
评价这篇论文

推荐

暂无数据
暂无数据