期刊
SCRIPTA MATERIALIA
卷 50, 期 4, 页码 477-481出版社
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.scriptamat.2003.10.034
关键词
recovery; X-ray diffraction; synchrotron radiation; 3DXRD; aluminium
An X-ray diffraction method is introduced for monitoring the change in volume and orientation of individual, embedded subgrains during static recovery. It is limited to plate-like specimens with a thickness of less than 100 subgrain sizes. Growth curves are presented for nine subgrains within a 38% cold-rolled aluminium specimen during annealing for 3 h at 300 degreesC. (C) 2003 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
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