Depth profiling of phase composition in a novel Ti3SiC2-TiC system with graded interfaces

A high-temperature vacuum heat-treatment process has been used to design novel Ti3SiC2 - TiC composites with graded interfaces. The phase evolution and the graded nature of this system have been characterised by X-ray diffraction (XRD) and grazing-incidence synchrotron radiation diffraction (GISRD). Results show that a TiC layer commenced to form near the surface of Ti3SiC2 at 1200 degreesC in vacuum and grew rapidly in thickness with temperature rising to 1500 degreesC. Depth profiling of the TiC layer by XRD and GISRD has revealed a distinct gradation in phase composition. (C) 2003 Elsevier B.V. All rights reserved.