Soft X-ray resonant magnetic scattering studies on Co2MnGe Heusler films

We report on soft-X-ray resonant magnetic scattering studies performed at the Mn and Co L-3.2 edges of Co2MnGe Heusler films. The samples were prepared by RF-sputtering and have shown a ferromagnetic behavior with a coercive field of 30-70 Oe, depending on the layer thickness. The intensity of the scattered beam has been measured as a function of photon energy and magnetic field. (C) 2003 Elsevier B.V. All rights reserved.