4.4 Article

Growth of calcium carbonate by the atomic layer chemical vapour deposition technique

期刊

THIN SOLID FILMS
卷 450, 期 2, 页码 240-247

出版社

ELSEVIER SCIENCE SA
DOI: 10.1016/j.tsf.2003.10.152

关键词

atomic layer deposition (ALD); calcium carbonate (CaCO3)

向作者/读者索取更多资源

Thin films of CaCO3 (calcite) have been grown with the atomic layer chemical vapour deposition (ALCVD) technique, using Ca(thd)(2) (Hthd = 2,2,6,6-tetramethylheptan-3,5-dione), CO2, and ozone as precursors. Pulse parameters for the ALCVD-type growth are found and self-limiting reaction conditions are established between 200 and 400 degreesC. Calcium carbonate films have been deposited on soda-lime glass, Si(100), alpha-Al2O3(001), alpha-Al2O3(012), alpha-SiO2(001), and MgO(100) substrates. The observed textures were: in-plane oriented films with [100](001)CaCO3\\ [100](001)Al2O3 and [100](001)CaCO3\\[110](001)Al2O3 on alpha-Al2O3(001), amorphous films on alpha-Al2O3(012) when grown at 250 degreesC, and columnar oriented films on soda-lime glass, Si(001), alpha-SiO2(001) and MgO(100) substrates with (00l) and (104) parallel to the substrate plane at 250 and 350 degreesC, respectively. The film topography was studied by atomic force microscopy and AC impedance characteristics were measured on as-deposited films at room temperature. The films were found to be insulating with a dielectric constant (epsilon(r)) typically approximately 8. Thin films of CaO were obtained by heat treatment of the carbonate films at 670 degreesC in a CO2-free atmosphere, but the thermal decomposition led to a significant increase in surface roughness. (C) 2003 Elsevier B.V. All rights reserved.

作者

我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。

评论

主要评分

4.4
评分不足

次要评分

新颖性
-
重要性
-
科学严谨性
-
评价这篇论文

推荐

暂无数据
暂无数据