Nodal order parameter in electron-doped Pr2-xCexCuO4-δ superconducting films -: art. no. 157005

The London penetration depth, lambda(ab)(T), is reported for thin films of the electron-doped superconductor Pr2-xCexCuO4-delta with varying Ce concentration, x=0.13, 0.15, and 0.17. Measurements down to 0.35 K were carried out using a tunnel-diode oscillator with excitation fields applied both perpendicular and parallel to the conducting planes. Films at all three doping levels exhibited power law behavior indicative of d-wave pairing with impurity scattering. These results are fully consistent with previous measurements on single crystals.