4.7 Article

Nonparametric weighted feature extraction for classification

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IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TGRS.2004.825578

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dimensionality reduction; discriminant analysis; nonparametric feature extraction

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In this paper, a new nonparametric feature extraction method is proposed for high-dimensional multiclass pattern recognition problems. It is based on a nonparametric extension of scatter matrices. There are at least two advantages to using the proposed nonparametric scatter matrices. First, they are generally of full rank. This provides the ability to specify the number of extracted features desired and to reduce the effect of the singularity problem. This is in contrast to parametric discriminant analysis, which usually only can extract L - 1 (number of classes minus one) features. In a real situation, this may not be enough. Second, the nonparametric nature of scatter matrices reduces the effects of outliers and works well even for nonnormal datasets. The new method provides greater weight to samples near the expected decision boundary. This tends to provide for increased classification accuracy.

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