期刊
PHYSICAL REVIEW B
卷 69, 期 20, 页码 -出版社
AMERICAN PHYSICAL SOC
DOI: 10.1103/PhysRevB.69.201402
关键词
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We present local conductance measurements of carbon nanotube networks with nanometer scale resolution and show that there are discrete drops in conductance that correspond to junctions of metallic nanotubes and semiconducting nanotubes. The anomalies of these networks compared to thin films are shown, and a new method of discerning between semiconducting and metallic single-wall carbon nanotubes is demonstrated.
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