期刊
PHYSICAL REVIEW LETTERS
卷 92, 期 20, 页码 -出版社
AMER PHYSICAL SOC
DOI: 10.1103/PhysRevLett.92.203001
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The double ionization of xenon in the multiphoton regime has been studied at two wavelengths (0.77 and 0.79 mum) using an electron-ion coincidence technique and an intensity binned ion ratio method. Sharp resonant structures in the electron energy distribution correlated with the doubly charged ion, as well as a wavelength dependence of the Xe2+/Xe+ ratio provides new insights. A mechanism involving the shelving of population in Rydberg states followed by excitation of a core electron is proposed.
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