期刊
VACUUM
卷 74, 期 2, 页码 223-227出版社
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.vacuum.2003.12.128
关键词
DFM; KPFM; contact potential difference (CPD); InSb; Au; growth
Dynamic force microscopy and Kelvin probe force microscopy (KPFM) have been used to study 0.2 ML Au deposited on clean c(8 x 2) InSb(001) surface. Rectangular islands of typical size of 9 nm across have been observed. Upon annealing at 650 K these islands preserve their initial shape. KPFM has shown that the islands are made of material chemically different from that of the surrounding substrate surface. However, the change of LEED pattern to c(4 x 4) strongly suggests conversion of substrate surface between the islands from In-rich to Sb-rich probably due to alloying of surface indium with gold in the islands. (C) 2004 Elsevier Ltd. All rights reserved.
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