4.6 Article Proceedings Paper

Surface structure of Au/InSb(001) system investigated with scanning force microscopy

期刊

VACUUM
卷 74, 期 2, 页码 223-227

出版社

PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.vacuum.2003.12.128

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DFM; KPFM; contact potential difference (CPD); InSb; Au; growth

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Dynamic force microscopy and Kelvin probe force microscopy (KPFM) have been used to study 0.2 ML Au deposited on clean c(8 x 2) InSb(001) surface. Rectangular islands of typical size of 9 nm across have been observed. Upon annealing at 650 K these islands preserve their initial shape. KPFM has shown that the islands are made of material chemically different from that of the surrounding substrate surface. However, the change of LEED pattern to c(4 x 4) strongly suggests conversion of substrate surface between the islands from In-rich to Sb-rich probably due to alloying of surface indium with gold in the islands. (C) 2004 Elsevier Ltd. All rights reserved.

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