期刊
JOURNAL OF MICROSCOPY-OXFORD
卷 214, 期 -, 页码 237-245出版社
BLACKWELL PUBLISHING LTD
DOI: 10.1111/j.0022-2720.2004.01329.x
关键词
adhesion; aluminium; coating; focused ion beam; grain boundary; pseudoboehmite; TEM preparation
类别
The dual-beam microscope is a combination of a focused ion beam with an electron beam. The instrument used in this work is also equipped with an energy-dispersive X-ray system for local elemental analysis. This powerful tool gives access to specific features inside a material. Two different applications are presented in this paper: (1) cross-sections and transmission electron microscope specimens cut in order to investigate the interface between an aluminium substrate and its epoxy coating; and (2) a grain boundary in a Cu3Au alloy. In both cases, the dual beam succeeded where other methods failed.
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