期刊
JOURNAL OF SYNCHROTRON RADIATION
卷 11, 期 -, 页码 353-357出版社
BLACKWELL MUNKSGAARD
DOI: 10.1107/S0909049504013767
关键词
X-ray magnetic scattering
Interest in the use of soft X-ray resonant magnetic scattering techniques to probe the distribution of magnetic moments in thin films has exploded during the last few years. In this paper a novel diffractometer devoted to temperature-dependent soft X-ray resonant scattering is described. The principal features of the diffractometer are presented and illustrated through experiments performed at LURE during the commissioning phase.
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