4.7 Article

Structural, optoelectronic, luminescence and thermal properties of Ga-doped zinc oxide thin films

期刊

APPLIED SURFACE SCIENCE
卷 258, 期 24, 页码 9969-9976

出版社

ELSEVIER
DOI: 10.1016/j.apsusc.2012.06.058

关键词

Ga:ZnO thin films; Raman; XPS; Morphological; Optoelectrical

资金

  1. Defense Research and Development Organization (DRDO), New Delhi [ERIP/ER/0503504/M/01/1007]
  2. UGC-DSA-I
  3. DST-PURSE
  4. DST-FIST-II

向作者/读者索取更多资源

Ga-doped ZnO thin films are synthesized by chemical spray pyrolysis onto corning glass substrates in aqueous media. The influence of gallium doping on to the photoelectrochemical, structural, Raman, XPS, morphological, optical, electrical, photoluminescence and thermal properties have been investigated in order to achieve good quality films. X-ray diffraction study depicts the films are polycrystalline and fit well with hexagonal (wurtzite) crystal structure with strong orientations along the (0 0 2) and (1 0 1) planes. Presence of E-2(high) mode in Raman spectra indicates that the gallium doping does not change the wurtzite structure. The coupling strength between electron and LO phonon has experimentally estimated. In order to understand the chemical bonding structure and electronic states of the Ga-doped ZnO thin films XPS analysis have been studied. SEM images shows the films are adherent, compact, densely packed with hexagonal flakes and spherical grains. Optical transmittance and reflectance measurements have been carried out. Room temperature PL spectra depict violet, blue and green emission in deposited films. The specific heat and thermal conductivity study shows the phonon conduction behavior is dominant in these polycrystalline films. (C) 2012 Elsevier B.V. All rights reserved.

作者

我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。

评论

主要评分

4.7
评分不足

次要评分

新颖性
-
重要性
-
科学严谨性
-
评价这篇论文

推荐

暂无数据
暂无数据