期刊
JOURNAL OF ELECTROCERAMICS
卷 13, 期 1-3, 页码 89-93出版社
KLUWER ACADEMIC PUBL
DOI: 10.1007/s10832-004-5081-3
关键词
ferroelectric; domain; thin film
The three dimensional domain structure of barium titanate thin films was determined using a serial sectioning technique. The domain structure varied sharply through the film thickness, being primarily a-oriented near the substrate and increasingly c-oriented away from this interface. The variation in domain structure is explained in terms of a strain gradient due to partial relaxation of epitaxial coherency strains. The refractive index also varied through the film thickness. A simple relationship based on areal fraction of each domain type aptly described the changes in refractive index with domain structure. These results indicate the importance of understanding three-dimensional domain structure and its impact on film properties.
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