期刊
APPLIED SURFACE SCIENCE
卷 257, 期 15, 页码 6804-6810出版社
ELSEVIER
DOI: 10.1016/j.apsusc.2011.02.134
关键词
XPS; Electrical properties; Mechanical properties; Optical properties
类别
资金
- Ministry of New and Renewable Energy, Govt. of India
- CSIR, Govt. of India [NWP-0027]
In the present work the correlation of electrical, optical and nano-mechanical properties of argon-diluted diamond-like carbon (Ar-DLC) thin films with sp(3) and sp(2) fractions of carbon have been explored. These Ar-DLC thin films have been deposited, under varying C2H2 gas pressures from 25 to 75 mTorr, by radio frequency-plasma enhanced chemical vapor deposition technique. X-ray photoelectron spectroscopy studies are performed to estimate the sp(3) and sp(2) fractions of carbon by deconvoluting C 1s core level spectra. Various electrical, optical and nano-mechanical parameters such as conductivity, I-V characteristics, optical band gap, stress, hardness, elastic modulus, plastic resistance parameter, elastic recovery and plastic deformation energy have been estimated and then correlated with calculated sp(3) and sp(2) fractions of carbon and sp(3)/sp(2) ratios. Observed tremendous electrical, optical and nano-mechanical properties in Ar-DLC films deposited under high base pressure conditions made it a cost effective material for not only hard and protective coating applications but also for electronic and optoelectronic applications. (C) 2011 Elsevier B. V. All rights reserved.
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