期刊
APPLIED SURFACE SCIENCE
卷 256, 期 14, 页码 4411-4416出版社
ELSEVIER
DOI: 10.1016/j.apsusc.2009.12.057
关键词
Mn3O4 thin films; SILAR; Surface morphology; Supercapacitor
类别
资金
- University Grants Commission (UGC), New Delhi [36207/2008 (SR)]
Mn3O4 thin films have been prepared by novel chemical successive ionic layer adsorption and reaction (SILAR) method. Further these films were characterized for their structural, morphological and optical properties by means of X-ray diffraction (XRD), Fourier transform infrared spectrum (FTIR), field emission scanning electron microscopy (FESEM), wettability test and optical absorption studies. The XRD pattern showed that the Mn3O4 films exhibit tetragonal hausmannite structure. Formation of manganese oxide compound was confirmed from FTIR studies. The optical absorption showed existence of direct optical band gap of energy 2.30 eV. Mn3O4 film surface showed hydrophilic nature with water contact angle of 558. The supercapacitive properties of Mn3O4 thin film investigated in 1 M Na2SO4 electrolyte showed maximum supercapacitance of 314 F g(-1) at scan rate 5 mV s(-1). (C) 2009 Elsevier B.V. All rights reserved.
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